Analysis of a Partially Sealed Absorbing Cavity in a Packaged Microstrip Circuit

碩士 === 國立交通大學 === 電信工程研究所 === 84 === In this thesis we propose and analyze a partially sealed absorbing cavity in a packaged microstrip circuit. This structure is formed by absorbing dielectric layers attached on the top cover of the pack...

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Bibliographic Details
Main Authors: Chung, Her-Shuenn, 鍾合順
Other Authors: Chung Shyh-Jong
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/13440904829319324058
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Summary:碩士 === 國立交通大學 === 電信工程研究所 === 84 === In this thesis we propose and analyze a partially sealed absorbing cavity in a packaged microstrip circuit. This structure is formed by absorbing dielectric layers attached on the top cover of the packaged microstrip circuit and sandwiched by two metal diaphragms. Any device which tends to excite higher-order modes (parasitic modes) may be designed inside this cavity so that the excited higher-order modes are confined by the diaphragms and decayed by the absorbing layers. The method of lines coupled with the mode-matching method will be adopted to investigate this structure. The coupling effect, with respect to the microstrip dominant mode and higher-order modes, of two metal diaphragms will first be analyzed, and then the influences, on the characteristics of the cavity, of varying the position, width, and depth of the absorbing layers and the distance between the diaphragms will be investigated.