Power Driven Partial Scan Selection

• Main Authors: Nien, Ming-Chang, 粘明章
• Other Authors: Jing-Yang Jou
• Format: Others
• Language: zh-TW
• Published: 1996
• Online Access: http://ndltd.ncl.edu.tw/handle/53104097345456548033

碩士 === 國立交通大學 === 電子研究所 === 84 === The power consumption and testability are two of major considerations in modern VLSI design. A full-scan method had been used widely in the past to improve the testability of sequential circuits. Due to the lower overheads incurred, the partial-scan design has gradually become popular. The main issue of partial-scan design is how to select the scan flip- flops. In this thesis, we propose a partial scan selection strategy that based on the structural analysis approach and considers the area and power overheads simultaneously. A powerful samle-and-search algorithm is used to find the solution that minimizes the user-specified cost function in term of power and area overheads. The experimental results show that our sample-and-search algorithm can effectively find the best solution for almost all circuits, and a 25.58% saving of overheads on average was obtained for a specific cost function.