Power Driven Partial Scan Selection
碩士 === 國立交通大學 === 電子研究所 === 84 === The power consumption and testability are two of major considerations in modern VLSI design. A full-scan method had been used widely in the past to improve the testability of sequential circuits. Due to the lower ove...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/53104097345456548033 |