Study of Defects in ZnO Varistors

碩士 === 國立交通大學 === 電子物理學系 === 84 === In this research, Deep level transient spectroscopy measurement was employed to identify the activation energies and capture cross-sectionalareas for the trapping levels associated with the electronic...

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Bibliographic Details
Main Authors: Lin, Yu-Shun, 林于順
Other Authors: Wei-I Lee
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/17540502270330200369