Noise and Reliability Study of Lateral Bipolar Junction
碩士 === 國立臺灣科技大學 === 工程技術研究所 === 83 === Recently there has been a lot of interest in incorporating a bipolar junction transistor (BJT) into a CMOS process to utilize the advantages of BJTs and MOSFETs. The BiCMOS process with lateral BJTs inh...
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| Format: | Others |
| Language: | zh-TW |
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1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/64645689391180403167 |