EMI Analysis of CMOS Gates
碩士 === 國立臺灣科技大學 === 工程技術研究所 === 83 === CMOS devices are widely used in digital integrated circuits. The opetation of these IC''s may be interfered by electromagnetic interference ( EMI ) .EMI analyses and tests can provide us the EMI emission a...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/04732807689406661826 |