The Characterization of H concentration and its evolution in a- Si:H film deposited on the single-side polished Si wafers

碩士 === 國立清華大學 === 材料科學(工程)研究所 === 83 ===

Bibliographic Details
Main Authors: Yu-Sen Chu, 朱豫森
Other Authors: Jon-Yiew Gan
Format: Others
Language:zh-TW
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/31101620597901609121