Temperature Dependence Hall Measurement and Deep Level Transient Spectroscopy Measurement of Low Temperature MOCVD GaAs

Temperature Dependence Hall Measurement and Deep Level Transient Spectroscopy Measurement of Low Temperature MOCVD GaAs

碩士 === 國立交通大學 === 電子物理學系 === 83 === We use Temperature Dependence Hall (TDH)measurement and Deep Level Transient Spectroscopy(DLTS) measurement to investigate t- he properties of the low temperature(~500℃) MOCVD GaAs films(LT -GaAs). Using...

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Bibliographic Details
Main Authors:	Cheng-Fong Tseng, 曾建峰
Other Authors:	Wei-Kuo Chen
Format:	Others
Language:	zh-TW
Published:	1995
Online Access:	http://ndltd.ncl.edu.tw/handle/87777256483874982059

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