Temperature Dependence Hall Measurement and Deep Level Transient Spectroscopy Measurement of Low Temperature MOCVD GaAs
碩士 === 國立交通大學 === 電子物理學系 === 83 === We use Temperature Dependence Hall (TDH)measurement and Deep Level Transient Spectroscopy(DLTS) measurement to investigate t- he properties of the low temperature(~500℃) MOCVD GaAs films(LT -GaAs). Using...
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/87777256483874982059 |