Analyzing Ordered Categorical Data -- Optimizing the Manufacturing Process for Chip Resistor
碩士 === 義守大學 === 管理科學研究所 === 83 === This paper studies a quality improvement case of extremely thin and light chip resistor RC0.6. We use an L18 (21×37) orthogonal array allocating 7 control factors on an experimental plan. The quality response data are inevitably considered to be ordered Both Tag...
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| Format: | Others |
| Language: | zh-TW |
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1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40624063808892090291 |
| Summary: | 碩士 === 義守大學 === 管理科學研究所 === 83 ===
This paper studies a quality improvement case of extremely thin and light chip resistor RC0.6. We use an L18 (21×37) orthogonal array allocating 7 control factors on an experimental plan. The quality response data are inevitably considered to be ordered Both Taguchi's accumulation analysis method (1966, 1974) and Nair's scoring scheme (1986) are employed to analyze the data. Furthermore, we develope a weighted probability scoring scheme and a signal to noise (S/N) ratio in order to obtain optimal solutions. Finally, comparison among the three optimal solutions is made.
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