Analyzing Ordered Categorical Data -- Optimizing the Manufacturing Process for Chip Resistor
碩士 === 義守大學 === 管理科學研究所 === 83 === This paper studies a quality improvement case of extremely thin and light chip resistor RC0.6. We use an L18 (21×37) orthogonal array allocating 7 control factors on an experimental plan. The quality response data are inevitably considered to be ordered Both Tag...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40624063808892090291 |