Study on the Temperature Dependence for the Hot-Carrier Damages of the N-Channel MOS Transistor
碩士 === 大葉大學 === 電機工程研究所 === 83 ===
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49432597547462187068 |