The measurement of hydrogen concentration and void fraction of the a-Si:H film

碩士 === 國立清華大學 === 材料科學(工程)研究所 === 82 ===

Bibliographic Details
Main Authors: Hsieh, Ren Guey, 謝仁貴
Other Authors: Gan Jon Yiew
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/40826399224862334225