Physics, simulation and characterization of hot carrier injection induced reliability issues in submicron MOSFET''s
博士 === 國立交通大學 === 電子研究所 === 82 ===
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49237064299497257041 |