A study on clustered defects in manufacturing processes of integrated circuit industry
碩士 === 國立交通大學 === 統計學研究所 === 82 ===
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1994
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Online Access: | http://ndltd.ncl.edu.tw/handle/47974701643320056376 |
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ndltd-TW-082NCTU23370072016-07-18T04:09:41Z http://ndltd.ncl.edu.tw/handle/47974701643320056376 A study on clustered defects in manufacturing processes of integrated circuit industry 聚集性缺失發生在積體電路板製程上之研討 Qin, Mei Hui 秦美惠 碩士 國立交通大學 統計學研究所 82 Hong, Zhi Zhen 洪志真 1994 學位論文 ; thesis 0 zh-TW |
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zh-TW |
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Others
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碩士 === 國立交通大學 === 統計學研究所 === 82 ===
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author2 |
Hong, Zhi Zhen |
author_facet |
Hong, Zhi Zhen Qin, Mei Hui 秦美惠 |
author |
Qin, Mei Hui 秦美惠 |
spellingShingle |
Qin, Mei Hui 秦美惠 A study on clustered defects in manufacturing processes of integrated circuit industry |
author_sort |
Qin, Mei Hui |
title |
A study on clustered defects in manufacturing processes of integrated circuit industry |
title_short |
A study on clustered defects in manufacturing processes of integrated circuit industry |
title_full |
A study on clustered defects in manufacturing processes of integrated circuit industry |
title_fullStr |
A study on clustered defects in manufacturing processes of integrated circuit industry |
title_full_unstemmed |
A study on clustered defects in manufacturing processes of integrated circuit industry |
title_sort |
study on clustered defects in manufacturing processes of integrated circuit industry |
publishDate |
1994 |
url |
http://ndltd.ncl.edu.tw/handle/47974701643320056376 |
work_keys_str_mv |
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