A study on clustered defects in manufacturing processes of integrated circuit industry

碩士 === 國立交通大學 === 統計學研究所 === 82 ===

Bibliographic Details
Main Authors: Qin, Mei Hui, 秦美惠
Other Authors: Hong, Zhi Zhen
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/47974701643320056376
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spelling ndltd-TW-082NCTU23370072016-07-18T04:09:41Z http://ndltd.ncl.edu.tw/handle/47974701643320056376 A study on clustered defects in manufacturing processes of integrated circuit industry 聚集性缺失發生在積體電路板製程上之研討 Qin, Mei Hui 秦美惠 碩士 國立交通大學 統計學研究所 82 Hong, Zhi Zhen 洪志真 1994 學位論文 ; thesis 0 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 統計學研究所 === 82 ===
author2 Hong, Zhi Zhen
author_facet Hong, Zhi Zhen
Qin, Mei Hui
秦美惠
author Qin, Mei Hui
秦美惠
spellingShingle Qin, Mei Hui
秦美惠
A study on clustered defects in manufacturing processes of integrated circuit industry
author_sort Qin, Mei Hui
title A study on clustered defects in manufacturing processes of integrated circuit industry
title_short A study on clustered defects in manufacturing processes of integrated circuit industry
title_full A study on clustered defects in manufacturing processes of integrated circuit industry
title_fullStr A study on clustered defects in manufacturing processes of integrated circuit industry
title_full_unstemmed A study on clustered defects in manufacturing processes of integrated circuit industry
title_sort study on clustered defects in manufacturing processes of integrated circuit industry
publishDate 1994
url http://ndltd.ncl.edu.tw/handle/47974701643320056376
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