A study on clustered defects in manufacturing processes of integrated circuit industry

碩士 === 國立交通大學 === 統計學研究所 === 82 ===

Bibliographic Details
Main Authors: Qin, Mei Hui, 秦美惠
Other Authors: Hong, Zhi Zhen
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/47974701643320056376