A Time_Saving Structural Testing Scheme For Mask_ROM
碩士 === 國立交通大學 === 電子研究所 === 82 === The analysis of the failure modes of mask_ROM leads to the optimal test vectors flow plan to reduce test time .
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/08882200320422307181 |