Using Ellipsometer to Deside The Optical Constant and Thickness of Single Film

碩士 === 國立清華大學 === 材料科學(工程)研究所 === 81 ===

Bibliographic Details
Main Authors: Wu, Shiao Chu, 吳曉竹
Other Authors: Gan Jon Yiew
Format: Others
Language:zh-TW
Published: 1993
Online Access:http://ndltd.ncl.edu.tw/handle/96649786761554640151