Studies on hot-carrier effects in short-channel n-MOSFETs by electrical and 1/f noise characterizations

博士 === 國立清華大學 === 電機工程研究所 === 80 ===

Bibliographic Details
Main Authors: CHE, SHENG-LI, 陳勝利
Other Authors: GONG, ZHENG
Format: Others
Language:zh-TW
Published: 1992
Online Access:http://ndltd.ncl.edu.tw/handle/92227741989397022279