Reliabilty comparison of submicrometer single and double metal LDD nMOSFETsFabrication of silicon on insulator by silicon wafer direct bonding technique
碩士 === 國立交通大學 === 電子研究所 === 80 ===
Main Authors: | GUO, XUE-WU, 高學武 |
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Other Authors: | YE, QING-FA |
Format: | Others |
Language: | zh-TW |
Published: |
1992
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Online Access: | http://ndltd.ncl.edu.tw/handle/26740475061323678572 |
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