Reliabilty comparison of submicrometer single and double metal LDD nMOSFETsFabrication of silicon on insulator by silicon wafer direct bonding technique

碩士 === 國立交通大學 === 電子研究所 === 80 ===

Bibliographic Details
Main Authors: GUO, XUE-WU, 高學武
Other Authors: YE, QING-FA
Format: Others
Language:zh-TW
Published: 1992
Online Access:http://ndltd.ncl.edu.tw/handle/26740475061323678572