Study on the effects of titanium mononitride (TiN) as an antireflection layer (ARL) in submicron-lithography

碩士 === 國立交通大學 === 應用化學研究所 === 79 ===

Bibliographic Details
Main Authors: QIU,GUO-DING, 邱國鼎
Other Authors: LONG,WEN-AN
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/37934117918881062046