An efficient pseudo exhaustive test pattern generation and test response compression method

碩士 === 國立成功大學 === 電機工程研究所 === 79 ===

Bibliographic Details
Main Author: 田子坤
Other Authors: ZHANG, JUN-YAN
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/70783714455495152789
id ndltd-TW-079NCKU2442021
record_format oai_dc
spelling ndltd-TW-079NCKU24420212016-07-25T04:07:07Z http://ndltd.ncl.edu.tw/handle/70783714455495152789 An efficient pseudo exhaustive test pattern generation and test response compression method 虛擬徹底式測試樣本產生及響應壓縮法 田子坤 碩士 國立成功大學 電機工程研究所 79 ZHANG, JUN-YAN FANG, YAN-KUN 王駿發 李肇嚴 1991 學位論文 ; thesis 0 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立成功大學 === 電機工程研究所 === 79 ===
author2 ZHANG, JUN-YAN
author_facet ZHANG, JUN-YAN
田子坤
author 田子坤
spellingShingle 田子坤
An efficient pseudo exhaustive test pattern generation and test response compression method
author_sort 田子坤
title An efficient pseudo exhaustive test pattern generation and test response compression method
title_short An efficient pseudo exhaustive test pattern generation and test response compression method
title_full An efficient pseudo exhaustive test pattern generation and test response compression method
title_fullStr An efficient pseudo exhaustive test pattern generation and test response compression method
title_full_unstemmed An efficient pseudo exhaustive test pattern generation and test response compression method
title_sort efficient pseudo exhaustive test pattern generation and test response compression method
publishDate 1991
url http://ndltd.ncl.edu.tw/handle/70783714455495152789
work_keys_str_mv AT tiánzikūn anefficientpseudoexhaustivetestpatterngenerationandtestresponsecompressionmethod
AT tiánzikūn xūnǐchèdǐshìcèshìyàngběnchǎnshēngjíxiǎngyīngyāsuōfǎ
AT tiánzikūn efficientpseudoexhaustivetestpatterngenerationandtestresponsecompressionmethod
_version_ 1718360509615439872