An efficient pseudo exhaustive test pattern generation and test response compression method

碩士 === 國立成功大學 === 電機工程研究所 === 79 ===

Bibliographic Details
Main Author: 田子坤
Other Authors: ZHANG, JUN-YAN
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/70783714455495152789