Characterization of Si and Sil-xGex epilayers grown by RTCBE

碩士 === 國立交通大學 === 材料科學工程研究所 === 78 ===

Bibliographic Details
Main Authors: WANG,ZHENG-TANG, 王政堂
Other Authors: ZHANG,JUN-YAN
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/45243747351920613878