Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique
碩士 === 國立臺灣大學 === 電機工程研究所 === 77 ===
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| Language: | zh-TW |
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1989
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11163102469577002406 |
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ndltd-TW-077NTU02442028 |
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ndltd-TW-077NTU024420282015-10-13T11:12:34Z http://ndltd.ncl.edu.tw/handle/11163102469577002406 Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique 以低頻C－V技術量測氧化鉭層之絕緣特性 LIN, XU-TING 林旭婷 碩士 國立臺灣大學 電機工程研究所 77 HU, ZHEN-GUO 胡振國 1989 學位論文 ; thesis 67 zh-TW |
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NDLTD |
| language |
zh-TW |
| format |
Others
|
| sources |
NDLTD |
| description |
碩士 === 國立臺灣大學 === 電機工程研究所 === 77 ===
|
| author2 |
HU, ZHEN-GUO |
| author_facet |
HU, ZHEN-GUO LIN, XU-TING 林旭婷 |
| author |
LIN, XU-TING 林旭婷 |
| spellingShingle |
LIN, XU-TING 林旭婷 Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| author_sort |
LIN, XU-TING |
| title |
Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| title_short |
Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| title_full |
Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| title_fullStr |
Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| title_full_unstemmed |
Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique |
| title_sort |
characterization of the insulating property of tantalum-oxide film by low-frequency c-v technique |
| publishDate |
1989 |
| url |
http://ndltd.ncl.edu.tw/handle/11163102469577002406 |
| work_keys_str_mv |
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