Characterization of the insulating property of tantalum-oxide film by low-frequency C-V technique

碩士 === 國立臺灣大學 === 電機工程研究所 === 77 ===

Bibliographic Details
Main Authors: LIN, XU-TING, 林旭婷
Other Authors: HU, ZHEN-GUO
Format: Others
Language:zh-TW
Published: 1989
Online Access:http://ndltd.ncl.edu.tw/handle/11163102469577002406