Sensitivity analysis of through-short-delay standards and its extension to microwave and millimeter-wave monolithic integrated circuit de-embedding

碩士 === 國立交通大學 === 電信研究所 === 76 ===

Bibliographic Details
Main Authors: ZHANG, GUO-BIN, 張國彬
Other Authors: ZHUANG, GIN-GUANG
Format: Others
Language:zh-TW
Published: 1988
Online Access:http://ndltd.ncl.edu.tw/handle/96906473683138213979