Thermally nitrided thin-oxide films for gate and novel field isolation applications in CMOS/VLSI:new technologies and their evaluations

博士 === 國立交通大學 === 電子研究所 === 75 ===

Bibliographic Details
Main Authors: CAI, HONG-XIANG, 蔡泓祥
Other Authors: WU, GING-YUAN
Format: Others
Language:zh-TW
Published: 1987
Online Access:http://ndltd.ncl.edu.tw/handle/37372030114937365630