Automatic test pattern generation for CMOS combinational circuits

Automatic test pattern generation for CMOS combinational circuits

碩士 === 國立成功大學 === 電機工程研究所 === 74 ===

Bibliographic Details
Main Authors:	GUO, DA-YUAN, 郭達源
Other Authors:	WANG, JUN-FA
Format:	Others
Language:	zh-TW
Published:	1986
Online Access:	http://ndltd.ncl.edu.tw/handle/24125839437845306704

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