Automatic test pattern generation for CMOS combinational circuits

碩士 === 國立成功大學 === 電機工程研究所 === 74 ===

Bibliographic Details
Main Authors: GUO, DA-YUAN, 郭達源
Other Authors: WANG, JUN-FA
Format: Others
Language:zh-TW
Published: 1986
Online Access:http://ndltd.ncl.edu.tw/handle/24125839437845306704