Analytical fits to Secondary Emission Yield Data

Analytical fits to Secondary Emission Yield Data

Bibliographic Details
Main Author: Vempati, Pratyusha
Language:English
Published: University of Cincinnati / OhioLINK 2018
Subjects:
Electrical Engineering
Secondary Electron Emission Yield
Secondary Electron Emission
Lin and Joy Model
Vaughan Fit
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801

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