Pseudo-Exhaustive Built-in Self-Testing for Signal Integrity of High-Speed SoC Interconnects
| Main Author: | |
|---|---|
| Language: | English |
| Published: |
University of Cincinnati / OhioLINK
2011
|
| Subjects: | |
| Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=ucin1320174248 |