The effect of surface recombination velocity on the high level injection current - voltage characteristics of wide based silicon p-i-n diodes /

Bibliographic Details
Main Author: Strong, Alvin Wayne
Language:English
Published: The Ohio State University / OhioLINK 1976
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu148700538432704