Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba<sub>x</sub>Sr<sub>1-x</sub>TiO<sub>3</sub> Grown by Molecular Beam Epitaxy

Growth Parameter Dependence and Correlation of Native Point Defects and Dielectric Properties in Ba<sub>x</sub>Sr<sub>1-x</sub>TiO<sub>3</sub> Grown by Molecular Beam Epitaxy

Bibliographic Details
Main Author: Rutkowski, Mitchell M.
Language:English
Published: The Ohio State University / OhioLINK 2013
Subjects:
Physics
Molecular Beam Epitaxy
Native Point Defect
Thin Film Growth
Depth Resolved Cathodoluminescence Spectroscopy
Barium Strontium Titanate
Interdigitated Capacitors
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1366299175

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