Trapping Effects in AlGaN/GaN HEMTs for High Frequency Applications : Modeling and Characterization Using Large Signal Network Analyzer and Deep Level Optical Spectroscopy
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Language: | English |
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The Ohio State University / OhioLINK
2011
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Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1310747425 |