Investigation of 4H and 6H-SIC thin films and schottky diodes using depth-dependent cathodoluminescence spectroscopy

Investigation of 4H and 6H-SIC thin films and schottky diodes using depth-dependent cathodoluminescence spectroscopy

Bibliographic Details
Main Author: Tumakha, Serhii
Language:English
Published: The Ohio State University / OhioLINK 2006
Subjects:
Silicon carbide
Schottky contact
4H-SiC
cathodoluminescence
defects
interfaces.
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1138202968

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1138202968

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