Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy
| Main Authors: | , , , , |
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| Language: | en |
| Published: |
American Institute of Physics
2006
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| Online Access: | http://dx.doi.org/10.1063/1.2358858 http://hdl.handle.net/2237/8768 |