Relating process measurements to customer dissatisfiers

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000. === Includes bibliographical references (p. 82). === by Mark Stephen Schaefer. === S.M.

Bibliographic Details
Main Author: Schaefer, Mark Stephen, 1972-
Other Authors: Roy E. Welsch and Daniel E. Whitney.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2014
Subjects:
Online Access:http://hdl.handle.net/1721.1/86550