Characterization and analysis of process variability in deeply-scaled MOSFETs

Characterization and analysis of process variability in deeply-scaled MOSFETs

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2012. === Cataloged from PDF version of thesis. === Includes bibliographical references (p. 137-147). === Variability characterization and analysis in advanced technologies are needed to ens...

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Bibliographic Details
Main Author: Balakrishnan, Karthik, Ph. D. Massachusetts Institute of Technology
Other Authors: Duane S. Boning.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2012
Subjects:
Electrical Engineering and Computer Science.
Online Access:http://hdl.handle.net/1721.1/70787

Internet

http://hdl.handle.net/1721.1/70787

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