Low-voltage spatial-phase-locked scanning-electron-beam lithography

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010. === Includes bibliographical references (p. 63-64). === Spatial-phase-locked electron-beam lithography (SPLEBL) is a method that tracks and corrects the position of an electron-beam in r...

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Bibliographic Details
Main Author: Cheong, Lin Lee
Other Authors: Henry I. Smith.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2010
Subjects:
Online Access:http://hdl.handle.net/1721.1/60159