Simulation of the effect of microstructure on electromigration induced failure of interconnects

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. === Includes bibliographical references (leaves 85-87). === by Walid R. Fayad. === M.S.

Bibliographic Details
Main Author:	Fayad, Walid R. (Walid Rahif)
Other Authors:	Carl V. Thompson.
Format:	Others
Language:	English
Published:	Massachusetts Institute of Technology 2009
Subjects:	Civil and Environmental Engineering
Online Access:	http://hdl.handle.net/1721.1/45477

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spelling	ndltd-MIT-oai-dspace.mit.edu-1721.1-454772019-05-02T15:43:58Z Simulation of the effect of microstructure on electromigration induced failure of interconnects Fayad, Walid R. (Walid Rahif) Carl V. Thompson. Massachusetts Institute of Technology. Dept. of Civil and Environmental Engineering Civil and Environmental Engineering Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. Includes bibliographical references (leaves 85-87). by Walid R. Fayad. M.S. 2009-04-29T17:48:07Z 2009-04-29T17:48:07Z 1997 1997 Thesis http://hdl.handle.net/1721.1/45477 37519913 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 87 leaves application/pdf Massachusetts Institute of Technology
collection	NDLTD
language	English
format	Others
sources	NDLTD
topic	Civil and Environmental Engineering
spellingShingle	Civil and Environmental Engineering Fayad, Walid R. (Walid Rahif) Simulation of the effect of microstructure on electromigration induced failure of interconnects
description	Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. === Includes bibliographical references (leaves 85-87). === by Walid R. Fayad. === M.S.
author2	Carl V. Thompson.
author_facet	Carl V. Thompson. Fayad, Walid R. (Walid Rahif)
author	Fayad, Walid R. (Walid Rahif)
author_sort	Fayad, Walid R. (Walid Rahif)
title	Simulation of the effect of microstructure on electromigration induced failure of interconnects
title_short	Simulation of the effect of microstructure on electromigration induced failure of interconnects
title_full	Simulation of the effect of microstructure on electromigration induced failure of interconnects
title_fullStr	Simulation of the effect of microstructure on electromigration induced failure of interconnects
title_full_unstemmed	Simulation of the effect of microstructure on electromigration induced failure of interconnects
title_sort	simulation of the effect of microstructure on electromigration induced failure of interconnects
publisher	Massachusetts Institute of Technology
publishDate	2009
url	http://hdl.handle.net/1721.1/45477
work_keys_str_mv	AT fayadwalidrwalidrahif simulationoftheeffectofmicrostructureonelectromigrationinducedfailureofinterconnects
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Simulation of the effect of microstructure on electromigration induced failure of interconnects

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