Simulation of the effect of microstructure on electromigration induced failure of interconnects
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. === Includes bibliographical references (leaves 85-87). === by Walid R. Fayad. === M.S.
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2009
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| Online Access: | http://hdl.handle.net/1721.1/45477 |