Design and implementation of a high precision profilometer
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1995. === Includes bibliographical references (p. 113-117 [i.e. p. [86]-[88]). === A high precision profilometry system was developed primarily for the inspection of two-sided sample specimens. Based upon system s...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2007
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| Online Access: | http://hdl.handle.net/1721.1/38196 |