Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing

Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing

Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. === Includes bibliographical references (leaves 66-67). === by Lance Edward Haag. === M.S.

Bibliographic Details
Main Author: Haag, Lance Edward
Other Authors: Steven D. Eppinger.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2007
Subjects:
Sloan School of Management
Electrical Engineering and Computer Science
Online Access:http://hdl.handle.net/1721.1/38107

Internet

http://hdl.handle.net/1721.1/38107

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