Tip steering of the Atomic Force Microscope.

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006. === Includes bibliographical references (p. 58-59). === The Atomic Force Microscope (AFM) is a powerful tool for the imaging of extremely small objects on the scale of nanometers, like carbon nanotubes and s...

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Bibliographic Details
Main Author: Kesner, Samuel B. (Samuel Benjamin)
Other Authors: Kamal Youcef-Toumi.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2007
Subjects:
Online Access:http://hdl.handle.net/1721.1/36755