Hot-carrier reliability evaluation for CMOS devices and circuits

Hot-carrier reliability evaluation for CMOS devices and circuits

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. === Includes bibliographical references (p. 138-139). === by Vei-Han Chan. === Ph.D.

Bibliographic Details
Main Author: Chan, Vei-Han
Other Authors: James E. Chung.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2007
Subjects:
Electrical Engineering and Computer Science
Online Access:http://hdl.handle.net/1721.1/36532

Internet

http://hdl.handle.net/1721.1/36532

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