Dynamic study of tunable stiffness scanning microscope probe

Dynamic study of tunable stiffness scanning microscope probe

Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2005. === Includes bibliographical references (leaf 31). === This study examines the dynamic characteristics of the in-plane tunable stiffness scanning microscope probe for an atomic force microscope (AFM). The an...

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Bibliographic Details
Main Author: Vega González, Myraida Angélica
Other Authors: Sang-Gook Kim.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2006
Subjects:
Mechanical Engineering.
Online Access:http://hdl.handle.net/1721.1/32967

Internet

http://hdl.handle.net/1721.1/32967

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