Fine-grained fault-tolerance : reliability as a fungible resource
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004. === Includes bibliographical references (p. 131-134). === The traditional design of logic circuits, based on reliable components, is incompatible with the next generation of devices rely...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2006
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| Online Access: | http://hdl.handle.net/1721.1/30103 |