Microstructure evolution and interconnect realiability

Microstructure evolution and interconnect realiability

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2000. === Includes bibliographical references (leaves 207-213). === In the context of predicting the effects of geometry, microstructure, and processing conditions on electromigration (EM) induced in...

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Bibliographic Details
Main Author: Fayad, Walid R. (Walid Rahif)
Other Authors: Carl V. Thompson.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2005
Subjects:
Civil and Environmental Engineering.
Online Access:http://hdl.handle.net/1721.1/17491

Internet

http://hdl.handle.net/1721.1/17491

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